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Characterization of high-Q optical microcavities using confocal microscopy

Kulkarni, Rajan P. and Fraser, Scott E. and Armani, Andrea M. (2008) Characterization of high-Q optical microcavities using confocal microscopy. Optics Letters, 33 (24). pp. 2931-2933. ISSN 0146-9592. doi:10.1364/OL.33.002931.

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Confocal microscopy was initially developed to image complex circuits and material defects. Previous imaging studies yielded only qualitative data about the location and number of defects. In the present study, this noninvasive method is used to obtain quantitative information about the Q factor of an optical resonant cavity. Because the intensity of the fluorescent signal measures the number of defects in the resonant cavity, this signal is a measure of the number of surface scattering defects, one of the dominant loss mechanisms in optical microcavities. The Q of the cavities was also determined using conventional linewidth measurements. Based upon a quantitative comparative analysis of these two techniques, it is shown that the Q can be determined without a linewidth measurement, allowing for a noninvasive characterization technique.

Item Type:Article
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URLURL TypeDescription
Fraser, Scott E.0000-0002-5377-0223
Armani, Andrea M.0000-0001-9890-5104
Additional Information:© 2008 Optical Society of America. Received June 2, 2008; revised October 24, 2008; accepted October 25, 2008; posted October 28, 2008 (Doc. ID 96876); published December 4, 2008. This work was supported at the California Institute of Technology at the Beckman Imaging Center and by the University of Southern California by the Program on Women in Science and Engineering (WISE) and the Provost’s Initiative on Biomedical Nanoscience.
Funding AgencyGrant Number
Caltech Beckman InstituteUNSPECIFIED
University of Southern CaliforniaUNSPECIFIED
Issue or Number:24
Classification Code:OCIS Codes: (100.2960) Image processing : Image analysis; (120.4630) Instrumentation, measurement, and metrology : Optical inspection; (120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness; (180.1790) Microscopy : Confoc
Record Number:CaltechAUTHORS:KULol08
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:13506
Deposited On:04 May 2009 15:50
Last Modified:08 Nov 2021 22:38

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