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High aspect ratio silicon dioxide-coated single-walled carbon nanotube scanning probe nanoelectrodes

Narui, Yoshie and Ceres, Donato M. and Chen, Jinyu and Giapis, Konstantinos P. and Collier, C. Patrick (2009) High aspect ratio silicon dioxide-coated single-walled carbon nanotube scanning probe nanoelectrodes. Journal of Physical Chemistry C, 113 (16). pp. 6815-6820. ISSN 1932-7447.

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We have fabricated high aspect ratio, hydrophilic nanoelectrodes from individual single-walled carbon nanotubes (SWNTs) mounted on conductive atomic force microscope (AFM) tips for use as electrochemical probes. Individual SWNTs with an average diameter of 5 nm and up to 1.5 μm in length were passivated with nanometer-thick SiO_2 films, deposited conformally in an inductively coupled plasma reactor. The electrically insulating SiO_2 films improved the nanotube rigidity and stabilized the nanotube−AFM tip contact to enable use in aqueous environments. The nanotube tip was successfully exposed by subjecting the probe to nanosecond electrical pulse etching but only after electron beam irradiation in a transmission electron microscope (TEM). Probe functionality was verified by electrodepositing gold nanoparticles from aqueous solution only at the exposed tip.

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Giapis, Konstantinos P.0000-0002-7393-298X
Additional Information:© 2009 American Chemical Society. Received: February 5, 2009; Revised Manuscript Received: February 20, 2009. The authors thank Carol Garland for assistance with TEM imaging. Nicholas Brunelli provided invaluable expertise with the ICP reactor. This work was supported by Arrowhead Research and Intel Corporation.
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Arrowhead ResearchUNSPECIFIED
Intel CorporationUNSPECIFIED
Issue or Number:16
Record Number:CaltechAUTHORS:20090803-082921286
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:14761
Deposited By: Tony Diaz
Deposited On:05 Aug 2009 23:20
Last Modified:03 Oct 2019 00:52

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