Mao, Peter H. and Burnett, Donald S. and Coath, Christopher D. and Jarzebinski, George and Kunihiro, Takuya and McKeegan, Kevin D. (2008) MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun’s oxygen isotopic composition. Applied Surface Science, 255 (4). pp. 1461-1464. ISSN 0169-4332. doi:10.1016/j.apsusc.2008.05.175. https://resolver.caltech.edu/CaltechAUTHORS:20090925-132008719
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Abstract
One of the primary objectives of the Genesis sample return mission is to measure the oxygen isotopic composition of the Sun to permil-level precision. The returned samples pose a unique analytical challenge, and around the world, there has been parallel development of several competing techniques to make the oxygen measurement on the Genesis concentrator samples. At UCLA, we have developed a hybrid instrument: a secondary ion mass spectrometer (SIMS) front-end combined with an accelerator mass spectrometer (AMS), whose purpose is to eliminate molecular interferences via dissociation. We describe here the current status of the development of the instrument and the remaining issues to address before we request the Genesis samples for analysis.
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| Additional Information: | © 2008 Elsevier B.V. Available online 15 May 2008. Funding for this work was provided by the NASA Discovery Program as part of the Genesis Mission. Airlock design was courtesy of John Craven at the University of Edinburgh; engineering of the airlock and sample stage was carried out by Richard Plue. | ||||||
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| Subject Keywords: | Solar abundances; Oxygen isotopes; Accelerator-based SIMS | ||||||
| Issue or Number: | 4 | ||||||
| DOI: | 10.1016/j.apsusc.2008.05.175 | ||||||
| Record Number: | CaltechAUTHORS:20090925-132008719 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20090925-132008719 | ||||||
| Official Citation: | Peter H. Mao, Donald S. Burnett, Christopher D. Coath, George Jarzebinski, Takuya Kunihiro, Kevin D. McKeegan, MegaSIMS: a SIMS/AMS hybrid for measurement of the Sun's oxygen isotopic composition, Applied Surface Science, Volume 255, Issue 4, Proceedings of the Sixteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVI, 15 December 2008, Pages 1461-1464, ISSN 0169-4332, DOI: 10.1016/j.apsusc.2008.05.175. (http://www.sciencedirect.com/science/article/B6THY-4SHF49N-C/2/edf596e3311b90ae1ad5ded4b9599d97) | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 16065 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Tony Diaz | ||||||
| Deposited On: | 02 Oct 2009 17:31 | ||||||
| Last Modified: | 08 Nov 2021 23:24 |
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