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Contact-limited currents in metal-insulator-metal structures

McGill, T. C. and Kurtin, S. and Fishbone, L. and Mead, C. A. (1970) Contact-limited currents in metal-insulator-metal structures. Journal of Applied Physics, 41 (9). pp. 3831-3839. ISSN 0021-8979.

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The physical mechanisms underlying current flow in solid-state MIM structures are reviewed with emphasis on criteria for determining the dominant conduction mechanism in a given experimental situation. Measurements of the bias and temperature dependence of currents through structures incorporating a thin film of single-crystal gallium selenide are reported, and are shown to be in excellent agreement with the predictions of a simple physical model of contact-limited emission. Independently measured properties of bulk single-crystal gallium selenide are used in all calculations; no adjustable parameters are employed. We believe that this study presents unequivocal evidence for contact-limited thermionic currents in solid-state MIM structures.

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Additional Information:Copyright © 1970 American Institute of Physics. Received 26 September 1969; revised 16 March 1970. This work supported in part by the Office of Naval Research. The authors would like to thank H. M. Simpson for constructing experimental apparatus employed in this series of experiments.
Issue or Number:9
Record Number:CaltechAUTHORS:MCGjap70b
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:1700
Deposited By: Tony Diaz
Deposited On:13 Feb 2006
Last Modified:02 Oct 2019 22:46

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