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Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers

Xu, Ke and Cao, Peigen and Heath, James R. (2009) Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers. Nano Letters, 9 (12). pp. 4446-4451. ISSN 1530-6984. https://resolver.caltech.edu/CaltechAUTHORS:20091223-134117061

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Abstract

We report on the scanning tunneling microscopy study of a new class of corrugations in exfoliated monolayer graphene sheets, that is, wrinkles ~10 nm in width and ~3 nm in height. We found such corrugations to be ubiquitous in graphene and have distinctly different properties when compared to other regions of graphene. In particular, a “three-for-six” triangular pattern of atoms is exclusively and consistently observed on wrinkles, suggesting the local curvature of the wrinkle provides a sufficient perturbation to break the 6-fold symmetry of the graphene lattice. Through scanning tunneling spectroscopy, we further demonstrate that the wrinkles have lower electrical conductance and are characterized by the presence of midgap states, which is in agreement with recent theoretical predictions. The observed wrinkles are likely important for understanding the electrical properties of graphene.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1021/nl902729p DOIArticle
http://pubs.acs.org/doi/abs/10.1021/nl902729pPublisherArticle
ORCID:
AuthorORCID
Heath, James R.0000-0001-5356-4385
Additional Information:© 2009 American Chemical Society. Received August 21, 2009; Revised Manuscript Received September 25, 2009. Publication Date (Web): October 23, 2009. We thank Wan Li (Cornell) for helpful discussions and assistance in graphene fabrication. This work was funded by the MARCO Center for Advanced Materials and Devices and by the Department of Energy (DE-FG02-04ER46175).
Funders:
Funding AgencyGrant Number
Microelectronics Advanced Research Corporation (MARCO)UNSPECIFIED
Department of Energy (DOE)DE-FG02-04ER46175
Issue or Number:12
Record Number:CaltechAUTHORS:20091223-134117061
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20091223-134117061
Official Citation:Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers Ke Xu, Peigen Cao, James R. Heath Nano Letters 2009 9 (12), 4446-4451
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:17032
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:05 Jan 2010 19:59
Last Modified:03 Oct 2019 01:21

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