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Ion-induced electron emission monitoring of the structure and morphology evolution in HOPG

Andrianova, N. N. and Borisov, A. M. and Mashkova, E. S. and Parilis, E. S. and Virgiliev, Yu.S. (2009) Ion-induced electron emission monitoring of the structure and morphology evolution in HOPG. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267 (16). pp. 2761-2764. ISSN 0168-583X. http://resolver.caltech.edu/CaltechAUTHORS:20100112-101723889

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Abstract

The temperature dependences of the ion-induced electron emission yield c of highly-oriented pyrolytic graphite (HOPG) under high-fluence (10^(18)–10^(19) ions/cm^2) 30 keV Ar^+ ion irradiation at ion incidence angles from θ = 0° (normal incidence) to 80° have been measured to trace both the structure and morphology changes in the basal oriented samples. The target temperature has been varied during continuous irradiation from T = -180 to 400°C. The surface analysis has been performed by the RHEED and SEM techniques. The surface microgeometry was studied using laser goniophotometry (LGF). The dependences of Υ(T) were found to be strongly non-monotonic and essentially different from the ones for Ar^+ and N_2 ^+ ion irradiation of the polygranular graphites. A sharp peak at irradiation temperature T_p 150°C was found. A strong influence of electron transport anisotropy has been observed, and ion-induced microgeometry is discussed.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.nimb.2009.05.022 DOIUNSPECIFIED
Additional Information:© 2009 Elsevier B.V. All rights reserved. Available online 27 May 2009. This work has been supported by the National project ‘‘Formation of the system of the innovation education at M.V. Lomonosov Moscow State University”. The authors are grateful to A.S. Nemov for help in the measurements and E.A. Pitirimova for performing RHEED.
Funders:
Funding AgencyGrant Number
Formation of the system of the innovation education at M.V. Lomonosov Moscow State UniversityUNSPECIFIED
Subject Keywords:High-fluence ion irradiation, Ion-induced electron emission, Radiation damage in carbon-based; materials
Issue or Number:16
Classification Code:PACS: 79.20-m 79.20.Rf
Record Number:CaltechAUTHORS:20100112-101723889
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20100112-101723889
Official Citation:Ion-induced electron emission monitoring of the structure and morphology evolution in HOPG Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms [0168-583X] Andrianova yr:2009 vol:267 iss:16 pg:2761 -2764
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:17143
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:26 Jan 2010 19:21
Last Modified:20 Oct 2014 17:32

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