Tayebi, Noureddine and Narui, Yoshie and Franklin, Nathan and Collier, C. Patrick and Giapis, Konstantinos P. and Nishi, Yoshio and Zhang, Yuegang (2010) Fully inverted single-digit nanometer domains in ferroelectric films. Applied Physics Letters, 96 (2). 023103. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:20100216-100459003
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Abstract
Achieving stable single-digit nanometer inverted domains in ferroelectric thin films is a fundamental issue that has remained a bottleneck for the development of ultrahigh density (>1 Tbit/in.^2) probe-based memory devices using ferroelectric media. Here, we demonstrate that such domains remain stable only if they are fully inverted through the entire ferroelectric film thickness, which is dependent on a critical ratio of electrode size to the film thickness. This understanding enables the formation of stable domains as small as 4 nm in diameter, corresponding to 10 unit cells in size. Such domain size corresponds to 40 Tbit/in.^2 data storage densities
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Additional Information: | © 2010 American Institute of Physics. Received 6 November 2009; accepted 5 December 2009; published 12 January 2010. Part of Y.Z.’s work was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. | |||||||||
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Issue or Number: | 2 | |||||||||
Record Number: | CaltechAUTHORS:20100216-100459003 | |||||||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20100216-100459003 | |||||||||
Official Citation: | Fully inverted single-digit nanometer domains in ferroelectric films Noureddine Tayebi, Yoshie Narui, Nathan Franklin, C. Patrick Collier, Konstantinos P. Giapis, Yoshio Nishi, and Yuegang Zhang, Appl. Phys. Lett. 96, 023103 (2010), DOI:10.1063/1.3280371 | |||||||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
ID Code: | 17482 | |||||||||
Collection: | CaltechAUTHORS | |||||||||
Deposited By: | Jason Perez | |||||||||
Deposited On: | 16 Feb 2010 21:12 | |||||||||
Last Modified: | 03 Oct 2019 01:28 |
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