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Thin film dielectric microstrip kinetic inductance detectors

Mazin, Benjamin A. and Sank, Daniel and McHugh, Sean and Lucero, Erik A. and Merrill, Andrew and Gao, Jiansong and Pappas, David and Moore, David and Zmuidzinas, Jonas (2010) Thin film dielectric microstrip kinetic inductance detectors. Applied Physics Letters, 96 (10). Art. No. 102504. ISSN 0003-6951.

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Microwave kinetic inductance detectors, or MKIDs, are a type of low temperature detector that exhibit intrinsic frequency domain multiplexing at microwave frequencies. We present the first theory and measurements on a MKID based on a microstrip transmission line resonator. A complete characterization of the dielectric loss and noise properties of these resonators is performed, and agrees well with the derived theory. A competitive noise equivalent power of 5×10^(−17) W Hz^(−1/2) at 10 Hz has been demonstrated. The resonators exhibit the highest quality factors known in a microstrip resonator with a deposited thin film dielectric.

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Additional Information:© 2010 American Institute of Physics. Received 7 October 2009; accepted 21 January 2010; published online 8 March 2010. This material is based upon work supported by the National Aeronautics and Space Administration under Grant No. NNH06ZDA001N-APRA2 issued through the Science Mission Directorate. The authors would like to thank John Martinis, Sunil Golwala, and Andrew Cleland for useful insights.
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Subject Keywords:dielectric losses, dielectric resonators, dielectric thin films, electron device noise, inductance measurement, microstrip resonators, microwave detectors, multiplexing, Q-factor
Issue or Number:10
Classification Code:PACS: 84.40.Az; 07.68.+m; 84.37.+q; 85.50.-n
Record Number:CaltechAUTHORS:20100407-135514104
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:17890
Deposited By: Tony Diaz
Deposited On:22 Apr 2010 15:47
Last Modified:03 Oct 2019 01:34

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