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An ICP variant using a point-to-line metric

Censi, Andrea (2008) An ICP variant using a point-to-line metric. In: Robotics and Automation, 2008. ICRA 2008. IEEE International Conference on. IEEE , New York, NY, pp. 19-25. ISBN 978-1-4244-1646-2.

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This paper describes PLICP, an ICP (iterative closest/corresponding point) variant that uses a point-to-line metric, and an exact closed-form for minimizing such metric. The resulting algorithm has some interesting properties: it converges quadratically, and in a finite number of steps. The method is validated against vanilla ICP, IDC (iterative dual correspondences), and MBICP (Metric-Based ICP) by reproducing the experiments performed in Minguez et al. (2006). The experiments suggest that PLICP is more precise, and requires less iterations. However, it is less robust to very large initial displacement errors. The last part of the paper is devoted to purely algorithmic optimization of the correspondence search; this allows for a significant speed-up of the computation. The source code is available for download.

Item Type:Book Section
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Censi, Andrea0000-0001-5162-0398
Additional Information:© 2008 IEEE. Issue Date: 19-23 May 2008; Date of Current Version: 13 June 2008.
Subject Keywords:Scan matching; localization; ICP; IDC; MbICP; metric; point-to-line
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INSPEC Accession Number10014280
Record Number:CaltechAUTHORS:20100512-152648883
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Official Citation:Censi, A.; , "An ICP variant using a point-to-line metric," Robotics and Automation, 2008. ICRA 2008. IEEE International Conference on , vol., no., pp.19-25, 19-23 May 2008 doi: 10.1109/ROBOT.2008.4543181 URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:18274
Deposited On:24 Jun 2010 19:22
Last Modified:08 Nov 2021 23:42

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