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Four-Dimensional Electron Microscopy

Zewail, Ahmed H. (2010) Four-Dimensional Electron Microscopy. Science, 328 (5975). pp. 187-193. ISSN 0036-8075. https://resolver.caltech.edu/CaltechAUTHORS:20100519-114244114

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Abstract

The discovery of the electron over a century ago and the realization of its dual character have given birth to one of the two most powerful imaging instruments: the electron microscope. The electron microscope’s ability to resolve three-dimensional (3D) structures on the atomic scale is continuing to affect different fields, including materials science and biology. In this Review, we highlight recent developments and inventions made by introducing the fourth dimension of time in electron microscopy. Today, ultrafast electron microscopy (4D UEM) enables a resolution that is 10 orders of magnitude better than that of conventional microscopes, which are limited by the video-camera rate of recording. After presenting the central concept involved, that of single-electron stroboscopic imaging, we discuss prototypical applications, which include the visualization of complex structures when unfolding on different length and time scales. The developed UEM variant techniques are several, and here we illucidate convergent-beam and near-field imaging, as well as tomography and scanning-pulse microscopy. We conclude with current explorations in imaging of nanomaterials and biostructures and an outlook on possible future directions in space-time, 4D electron microscopy.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1126/science.1166135DOIArticle
http://www.sciencemag.org/cgi/content/abstract/328/5975/187PublisherArticle
Additional Information:© 2010 American Association for the Advancement of Science. In the course of developments at the Center for Ultrafast Science and Technology (UST), I have enjoyed the scholarly discussions with and enthusiasm of J. M. Thomas of Cambridge University, the fruit of which resulted in his overview articles (40, 51–54) and our joint monograph (12) on 4D EM. The dedication and hard work of members of the UST Center made possible the story told here. I particularly wish to acknowledge the effort of D. Shorokhov in helpful discussion and in manuscript preparation. This research was carried out with support from NSF and the Air Force Office of Scientific Research in the Physical Biology Center for UST supported at Caltech by the Gordon and Betty Moore Foundation.
Funders:
Funding AgencyGrant Number
NSFUNSPECIFIED
Air Force Office of Scientific Research (AFOSR)UNSPECIFIED
Gordon and Betty Moore FoundationUNSPECIFIED
Issue or Number:5975
Record Number:CaltechAUTHORS:20100519-114244114
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20100519-114244114
Official Citation:Four-Dimensional Electron Microscopy BY AHMED H. ZEWAIL Science 09 Apr 2010: Vol. 328, Issue 5975, pp. 187-193 DOI: 10.1126/science.1166135
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:18352
Collection:CaltechAUTHORS
Deposited By: Jason Perez
Deposited On:29 Jun 2010 16:01
Last Modified:03 Oct 2019 01:41

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