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Supercooled melting in multicomponent Zr–Al–Cu–Ni diffusion couples

Busch, R. and Bakke, E. and Johnson, W. L. (1996) Supercooled melting in multicomponent Zr–Al–Cu–Ni diffusion couples. Applied Physics Letters, 68 (21). pp. 2945-2947. ISSN 0003-6951. doi:10.1063/1.116363. https://resolver.caltech.edu/CaltechAUTHORS:BUSapl96

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Abstract

Diffusion couples combining a hcp Zr90Al10 supersaturated solid solution with a fcc Cu64Ni36 solid solution were annealed at 410 °C for different times. The reaction at the interface was investigated by transmission electron microscopy and energy dispersive x-ray spectroscopy. The investigations show the formation of a noncrystalline layer at the interface between the two solid solutions that grows to a maximum thickness of more than 0.3 µm. Concentration profiles reveal that two noncrystalline phases coexist in the diffusion couple. One is Ni-rich and was in the amorphous state during the reaction at 410 °C. The other phase is Zr-rich and grew in its supercooled liquid state. This novel supercooled melting process has not been previously observed in a solid state reaction. Kinetic and thermodynamic aspects that contribute to the high thermal stability of the Zr–Al–Ni–Cu in the supercooled liquid are discussed.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1063/1.116363DOIUNSPECIFIED
Additional Information:©1996 American Institute of Physics. (Received 17 November 1995; accepted 13 March 1996) The authors thank C. Garland for her assistance with the TEM investigations and R. Bormann and S. Schneider for fruitful discussions. This work was supported by the U.S. Department of Energy (Grant No. DEFG-03-86ER45242). Partial support for R. Busch was provided by the Alexander von Humboldt Foundation via the Feodor Lynen Program.
Subject Keywords:ZIRCONIUM ALLOYS; ALUMINIUM ALLOYS; COPPER ALLOYS; NICKEL ALLOYS; QUATERNARY ALLOY SYSTEMS; DIFFUSION; INTERFACES; SOLID SOLUTIONS; ANNEALING; MELTING; PHASE TRANSFORMATIONS; MORPHOLOGY; X – RAY DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY; XRD; TEM; GLASS TRANSFORMATIONS
Issue or Number:21
DOI:10.1063/1.116363
Record Number:CaltechAUTHORS:BUSapl96
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:BUSapl96
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:1916
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:23 Feb 2006
Last Modified:08 Nov 2021 19:43

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