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Microwave Kinetic Inductance Detector (MKID) Camera Testing for Submillimeter Astronomy

Czakon, N. G. and Vayonakis, A. and Schlaerth, J. and Hollister, M. I. and Golwala, S. and Day, P. K. and Gao, J.-S. and Glenn, J. and Leduc, H. and Maloney, P. R. and Mazin, B. and Noroozian, O. and Nguyen, H. T. and Sayers, J. and Vaillancourt, J. E. and Zmuidzinas, J. (2009) Microwave Kinetic Inductance Detector (MKID) Camera Testing for Submillimeter Astronomy. In: Low temperature detectors LTD-13. AIP Conference Proceedings . No.1185. American Institute of Physics , Melville, NY, pp. 172-175. ISBN 978-0-7354-0751-0.

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Developing kilopixel focal planes for incoherent submm- and mm-wave detectors remains challenging due to either the large hardware overhead or the complexity of multiplexing standard detectors. Microwave kinetic inductance detectors (MKIDs) provide a efficient means to produce fully lithographic background-limited kilopixel focal planes. We are constructing an MKID-based camera for the Caltech Submillimeter Observatory with 576 spatial pixels each simultaneously sensitive in 4 bands at 230, 300, 350, and 400 GHz. The novelty of MKIDs has required us to develop new techniques for detector characterization. We have measured quasiparticle lifetimes and resonator Qs for detector bath temperatures between 200 mK and 400 mK. Equivalent lifetime measurements were made by coupling energy into the resonators either optically or by driving the third harmonic of the resonator. To determine optical loading, we use both lifetime and internal Q measurements, which range between 15,000 and 30,000 for our resonators. Spectral bandpass measurements confirm the placement of the 230 and 350 GHz bands. Additionally, beam maps measurements conform to expectations. The same device design has been characterized on both sapphire and silicon substrates, and for different detector geometries. We also report on the incorporation of new shielding to reduce detector sensitivity to local magnetic fields.

Item Type:Book Section
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URLURL TypeDescription
Golwala, S.0000-0002-1098-7174
Glenn, J.0000-0001-7527-2017
Sayers, J.0000-0002-8213-3784
Additional Information:© 2009 American Institute of Physics. Issue Date: 16 December 2009.
Subject Keywords:submillimeter instramentation; kinetic inductance detectors
Series Name:AIP Conference Proceedings
Issue or Number:1185
Classification Code:PACS: 95.55.Br
Record Number:CaltechAUTHORS:20100929-111815131
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Official Citation:Microwave Kinetic Inductance Detector (MKID) Camera Testing for Submillimeter Astronomy N. G. Czakon, A. Vayonakis, J. Schlaerth, M. I. Hollister, S. Golwala, P. K. Day, J.-S. Gao, J. Glenn, H. LeDuc, P. R. Maloney, B. Mazin, O. Noroozian, H. T. Nguyen, J. Sayers, J. E. Vaillancourt, and J. Zmuidzinas, AIP Conf. Proc. 1185, 172 (2009), DOI:10.1063/1.3292308
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:20218
Deposited By: Jason Perez
Deposited On:30 Sep 2010 15:29
Last Modified:09 Mar 2020 13:19

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