Boyd, D. A. and El-Naggar, M. Y. and Goodwin, D. G. (2006) In situ measurements of stress with temperature in thin film Pb_xBa_(1-x)TiO_3. Integrated Ferroelectrics, 83 (1). pp. 155-164. ISSN 1058-4587. doi:10.1080/10584580600950822. https://resolver.caltech.edu/CaltechAUTHORS:20110217-105906732
Full text is not posted in this repository. Consult Related URLs below.
Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20110217-105906732
Abstract
In situ curvature measurements were used to monitor the macroscopic film stress with temperature in well-oriented thin films of Pb_xBa_(1-x)TiO_3 (x = 0.2, 0.5, 1.0) on single crystal MgO (001). Successive measurements were made between room and the growth temperature, 650 °C. The films were found to be in compression at room temperature. The compressive stresses in the films continually decreased at nearly constant rates with increasing temperature, and near the Curie temperature for each composition Tc_(x) these rates increased. Energy minimization calculations were used to predict the changes in the domain volume fractions and the film stresses with temperature. We find qualitative agreement between the predicted and measured behavior of the domain volume fractions. However, the stress in the films is not relaxed below Tc_(x) as expected. We discuss the effects that may inhibit this relaxation, namely film thickness, growth effects, and the presence of grain boundaries
Item Type: | Article | |||||||||
---|---|---|---|---|---|---|---|---|---|---|
Related URLs: |
| |||||||||
Additional Information: | © 2006 Taylor & Francis Group. Received May 1, 2006; in final form May 27, 2006. This work has been supported by ARO MURI grant number DAADI9-01-1-0517. | |||||||||
Funders: |
| |||||||||
Subject Keywords: | Ferroelectrics; polydomain structures; thin films; film stress; stress relaxation; CGS; Coherent Gradient Sensing | |||||||||
Issue or Number: | 1 | |||||||||
DOI: | 10.1080/10584580600950822 | |||||||||
Record Number: | CaltechAUTHORS:20110217-105906732 | |||||||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20110217-105906732 | |||||||||
Official Citation: | IN SITU MEASUREMENTS OF STRESS WITH TEMPERATURE IN THIN FILM PbxBa1 - xTiO3 D. A. Boyd; M. Y. El-Naggar; D. G. Goodwin Pages 155 – 164 | |||||||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
ID Code: | 22351 | |||||||||
Collection: | CaltechAUTHORS | |||||||||
Deposited By: | Ruth Sustaita | |||||||||
Deposited On: | 17 Feb 2011 19:21 | |||||||||
Last Modified: | 09 Nov 2021 16:04 |
Repository Staff Only: item control page