Deceglie, Michael G. and Kelzenberg, Michael D. and Atwater, Harry A. (2010) Effects of bulk and grain boundary recombination on the efficiency of columnar-grained crystalline silicon film solar cells. In: 2010 35th IEEE Photovoltaic Specialists Conference (PVSC). IEEE Photovoltaic Specialists Conference . IEEE , Piscataway, NJ, pp. 1487-1490. ISBN 978-1-4244-5891-2. https://resolver.caltech.edu/CaltechAUTHORS:20110412-113433696
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Abstract
Columnar-grained polycrystalline silicon films deposited at low temperatures are promising materials for use in thin-film photovoltaics. We study the effects of recombination at grain boundaries, bulk intragranular recombination, grain size, and doping in such structures with two-dimensional device physics simulations, explicitly modeling the full statistics and electrostatics of traps at the grain boundary. We characterize the transition from grain-boundary-limited to bulk-lifetime-limited performance as a function of intergranular defect density and find that higher bulk lifetimes amplify grain boundary recombination effects in the intermediate regime of this transition. However, longer bulk lifetimes ultimately yield higher efficiencies. Additionally, heavier base doping is found to make performance less sensitive to grain boundary defect density.
| Item Type: | Book Section | ||||||
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| Additional Information: | © 2010 IEEE. Issue Date: 20-25 June 2010. Date of Current Version: 01 November 2010. The authors wish to thank Daniel B. Turner-Evans for useful discussions. This work is supported by BP Solar. | ||||||
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| Series Name: | IEEE Photovoltaic Specialists Conference | ||||||
| DOI: | 10.1109/PVSC.2010.5614346 | ||||||
| Record Number: | CaltechAUTHORS:20110412-113433696 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20110412-113433696 | ||||||
| Official Citation: | Deceglie, M.G.; Kelzenberg, M.D.; Atwater, H.A.; , "Effects of bulk and grain boundary recombination on the efficiency of columnar-grained crystalline silicon film solar cells," Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE , vol., no., pp.001487-001490, 20-25 June 2010 doi: 10.1109/PVSC.2010.5614346 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5614346&isnumber=5614036 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 23281 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Tony Diaz | ||||||
| Deposited On: | 26 May 2011 19:56 | ||||||
| Last Modified: | 09 Nov 2021 16:13 |
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