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Contour Detection and Hierarchical Image Segmentation

Arbeláez, Pablo and Maire, Michael and Fowlkes, Charless and Malik, Jitendra (2011) Contour Detection and Hierarchical Image Segmentation. IEEE Transactions on Pattern Analysis and Machine Intelligence, 33 (5). pp. 898-916. ISSN 0162-8828. https://resolver.caltech.edu/CaltechAUTHORS:20110415-113118411

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Abstract

This paper investigates two fundamental problems in computer vision: contour detection and image segmentation. We present state-of-the-art algorithms for both of these tasks. Our contour detector combines multiple local cues into a globalization framework based on spectral clustering. Our segmentation algorithm consists of generic machinery for transforming the output of any contour detector into a hierarchical region tree. In this manner, we reduce the problem of image segmentation to that of contour detection. Extensive experimental evaluation demonstrates that both our contour detection and segmentation methods significantly outperform competing algorithms. The automatically generated hierarchical segmentations can be interactively refined by userspecified annotations. Computation at multiple image resolutions provides a means of coupling our system to recognition applications.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1109/TPAMI.2010.161DOIArticle
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5557884&tag=1PublisherArticle
Additional Information:© 2011 IEEE. Manuscript received 16 Feb. 2010; accepted 5 July 2010; published online 19 Aug. 2010. Date of Current Version: 22 March 2011. Recommended for acceptance by P. Felzenszwalb.
Other Numbering System:
Other Numbering System NameOther Numbering System ID
INSPEC Accession Number11874884
Issue or Number:5
Record Number:CaltechAUTHORS:20110415-113118411
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20110415-113118411
Official Citation:Arbeláez, P.; Maire, M.; Fowlkes, C.; Malik, J.; , "Contour Detection and Hierarchical Image Segmentation," Pattern Analysis and Machine Intelligence, IEEE Transactions on , vol.33, no.5, pp.898-916, May 2011 doi: 10.1109/TPAMI.2010.161 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5557884&isnumber=5735600
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:23346
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:19 Apr 2011 16:12
Last Modified:03 Oct 2019 02:45

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