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Influence of Homogeneous Interfaces on the Strength of 500 nm Diameter Cu Nanopillars

Jang, Dongchan and Cai, Can and Greer, Julia R. (2011) Influence of Homogeneous Interfaces on the Strength of 500 nm Diameter Cu Nanopillars. Nano Letters, 11 (4). pp. 1743-1746. ISSN 1530-6984. https://resolver.caltech.edu/CaltechAUTHORS:20110429-104239248

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Abstract

Interfaces play an important role in crystalline plasticity as they affect strength and often serve as obstacles to dislocation motion. Here we investigate effects of grain and nanotwin boundaries on uniaxial strength of 500 nm diameter Cu nanopillars fabricated by e-beam lithography and electroplating. Uniaxial compression experiments reveal that strength is lowered by introducing grain boundaries and significantly rises when twin boundaries are present. Weakening is likely due to the activation of grain-boundary-mediated processes, while impeding dislocation glide can be responsible for strengthening by twin boundaries.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1021/nl2003076DOIArticle
http://pubs.acs.org/doi/abs/10.1021/nl2003076PublisherArticle
ORCID:
AuthorORCID
Jang, Dongchan0000-0002-2814-9734
Greer, Julia R.0000-0002-9675-1508
Additional Information:© 2011 American Chemical Society. Published In Issue April 13, 2011; Article ASAP: March 09, 2011; Received: January 26, 2011; Revised: February 18, 2011. The authors gratefully acknowledge the financial support of the NSF-sponsored MRSEC Center at Caltech (DMR-0520565). The authors also gratefully acknowledge critical support and infrastructure provided for this work by the Kavli Nanoscience Institute at Caltech.
Group:Kavli Nanoscience Institute
Funders:
Funding AgencyGrant Number
NSFDMR-0520565
Subject Keywords:Nanopillars; nanocrystalline; nanotwins; uniaxial compression; nanomechanics
Issue or Number:4
Record Number:CaltechAUTHORS:20110429-104239248
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20110429-104239248
Official Citation:Influence of Homogeneous Interfaces on the Strength of 500 nm Diameter Cu Nanopillars Dongchan Jang, Can Cai, Julia R. Greer Nano Letters 2011 11 (4), 1743-1746
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:23501
Collection:CaltechAUTHORS
Deposited By: Jason Perez
Deposited On:29 Apr 2011 20:55
Last Modified:03 Oct 2019 02:47

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