CaltechAUTHORS
  A Caltech Library Service

Microsecond minority carrier lifetimes in HWCVD-grown films and implications for thin film solar cells

Mason, M. S. and Richardson, C. E. and Atwater, H. A. and Ahrenkiel, R. K. (2006) Microsecond minority carrier lifetimes in HWCVD-grown films and implications for thin film solar cells. Thin Solid Films, 501 (1-2). pp. 288-290. ISSN 0040-6090. https://resolver.caltech.edu/CaltechAUTHORS:20110714-134328370

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20110714-134328370

Abstract

We determine the minority carrier lifetimes of nearly intrinsic Si films 1.5–15 μm thick grown by HWCVD at 300 °C on Si (100) and large-grained polycrystalline templates formed by selective nucleation and solid-phase epitaxy (SNSPE) using resonant-coupled photoconductive decay (RCPCD). Although the microstructure of these films is mostly microcrystalline, minority carrier lifetimes for films on Si (100) range from 5.7 to 14.8 μs while those for films on SNSPE templates range from 5.9 to 19.3 μs. Residual nickel present in the SNSPE templates may contribute a recombination center but does not significantly decrease the lifetime of films grown on SNSPE templates, making the growth of epitaxial layers by HWCVD on SNSPE templates a viable design for thin-film photovoltaics.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.tsf.2005.07.197DOIArticle
http://www.sciencedirect.com/science/article/pii/S0040609005010709PublisherArticle
ORCID:
AuthorORCID
Atwater, H. A.0000-0001-9435-0201
Additional Information:© 2005 Elsevier B.V. Available online 10 August 2005.
Subject Keywords:hot-wire deposition; silicon; photoconductive decay; photovoltaics
Issue or Number:1-2
Record Number:CaltechAUTHORS:20110714-134328370
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20110714-134328370
Official Citation:M.S. Mason, C.E. Richardson, H.A. Atwater, R.K. Ahrenkiel, Microsecond minority carrier lifetimes in HWCVD-grown films and implications for thin film solar cells, Thin Solid Films, Volume 501, Issues 1-2, Proceedings of the Third International Conference on Hot-Wire CVD (Cat-CVD) Process, 20 April 2006, Pages 288-290, ISSN 0040-6090, DOI: 10.1016/j.tsf.2005.07.197. (http://www.sciencedirect.com/science/article/pii/S0040609005010709)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:24425
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:04 Aug 2011 23:05
Last Modified:03 Oct 2019 02:56

Repository Staff Only: item control page