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Models for quantitative charge imaging by atomic force microscopy

Boer, Elizabeth A. and Bell, L. D. and Brongersma, Mark L. and Atwater, Harry A. (2001) Models for quantitative charge imaging by atomic force microscopy. Journal of Applied Physics, 90 (6). pp. 2764-2772. ISSN 0021-8979. https://resolver.caltech.edu/CaltechAUTHORS:BOEjap01

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Abstract

Two models are presented for quantitative charge imaging with an atomic-force microscope. The first is appropriate for noncontact mode and the second for intermittent contact (tapping) mode imaging. Different forms for the contact force are used to demonstrate that quantitative charge imaging is possible without precise knowledge of the contact interaction. From the models, estimates of the best charge sensitivity of an unbiased standard atomic-force microscope cantilever are found to be on the order of a few electrons.


Item Type:Article
ORCID:
AuthorORCID
Atwater, Harry A.0000-0001-9435-0201
Additional Information:© 2001 American Institute of Physics. (Received 27 February 2001; accepted 24 June 2001) The research described in this article was jointly sponsored by the National Aeronautics and Space Administration (NASA) and the Jet Propulsion Laboratory Director's Research and Development Fund, and by the National Science Foundation under Grant No. DMR98-71850.
Funders:
Funding AgencyGrant Number
NASA/JPLUNSPECIFIED
JPL Director’s Research and Development FundUNSPECIFIED
NSFDMR98-71850
Subject Keywords:atomic force microscopy
Issue or Number:6
Record Number:CaltechAUTHORS:BOEjap01
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:BOEjap01
Alternative URL:http://dx.doi.org/10.1063/1.1394896
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2482
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:05 Apr 2006
Last Modified:02 Oct 2019 22:53

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