Rokhsari, H. and Spillane, S. M. and Vahala, K. J. (2004) Loss characterization in micro-cavities using the thermal bistability effect. In: 2004 Digest of the LEOS Summer Topical Meetings. IEEE , Piscataway, NJ, pp. 52-53. ISBN 0-7803-8306-0. https://resolver.caltech.edu/CaltechAUTHORS:20110824-081843508
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Abstract
We investigate the role of absorption and scattering losses in limiting the quality factor of toroidal micro-cavities by monitoring the threshold power for thermal bistability in these structures.
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| Additional Information: | © 2004 IEEE. Issue Date: 28-30 July 2004. Date of Current Version: 08 October 2004. | |||||||||
| Record Number: | CaltechAUTHORS:20110824-081843508 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20110824-081843508 | |||||||||
| Official Citation: | Rokhsari, H.; Spillane, S.M.; Vahala, K.J.; , "Loss characterization in micro-cavities using the thermal bistability effect," Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004 Digest of the LEOS Summer Topical Meetings , vol., no., pp. 2 pp., 28-30 June 2004 doi: 10.1109/LEOSST.2004.1338754 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1338754&isnumber=29519 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 25002 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Tony Diaz | |||||||||
| Deposited On: | 09 Sep 2011 22:26 | |||||||||
| Last Modified: | 03 Oct 2019 03:01 |
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