Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. I. Journal of Applied Physics, 14 (1). pp. 8-18. ISSN 0021-8979. doi:10.1063/1.1714924. https://resolver.caltech.edu/CaltechAUTHORS:BACjap43a
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Abstract
This paper, consisting of three parts, describes investigations made with the objective of developing a simplified, practical microscope of the type which yields magnified images of transparent specimens with a resolving power superior to that of the best light microscopes. The first part deals with the general problem of design, including the electron gun and the imaging lenses. A later part will describe a completed instrument embodying many of the results of the investigations.
| Item Type: | Article | ||||||
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| Additional Information: | © 1943 American Institute of Physics | ||||||
| Issue or Number: | 1 | ||||||
| DOI: | 10.1063/1.1714924 | ||||||
| Record Number: | CaltechAUTHORS:BACjap43a | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:BACjap43a | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 2508 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Archive Administrator | ||||||
| Deposited On: | 06 Apr 2006 | ||||||
| Last Modified: | 08 Nov 2021 19:48 |
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