Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. II. Journal of Applied Physics, 14 (2). pp. 69-77. ISSN 0021-8979. doi:10.1063/1.1714953. https://resolver.caltech.edu/CaltechAUTHORS:BACjap43b
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Abstract
This paper is a continuation of the description of problems arising in the development and design of an electrostatic electron microscope. The present article discusses depth of focus, lens and field stops, shielding, manufacturing tolerances, the choice of the number of stages of magnification, and alternative methods of viewing and recording the final image. A following paper will describe a completed instrument.
| Item Type: | Article | ||||||
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| Additional Information: | © 1943 American Institute of Physics | ||||||
| Issue or Number: | 2 | ||||||
| DOI: | 10.1063/1.1714953 | ||||||
| Record Number: | CaltechAUTHORS:BACjap43b | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:BACjap43b | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 2509 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Archive Administrator | ||||||
| Deposited On: | 06 Apr 2006 | ||||||
| Last Modified: | 08 Nov 2021 19:48 |
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