Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. III. Journal of Applied Physics, 14 (4). pp. 155-160. ISSN 0021-8979. doi:10.1063/1.1714968. https://resolver.caltech.edu/CaltechAUTHORS:BACjap43c
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Abstract
This article, the final one of a series on the design of electrostatic electron microscopes, contains a description of an instrument which illustrates the principles previously discussed. The microscope described is believed to be the first constructed with the object of providing the greatest of simplicity in construction, operation, and maintenance with the design parameters balanced to give a particular range of resolving power. The range chosen is about ten times the light microscope. The instrument is permanently aligned and utilizes external photography. The over-all size and weight of the instrument, as well as the number and complexity of components, are materially less than previously described instruments.
| Item Type: | Article | ||||||
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| Additional Information: | © 1943 American Institute of Physics | ||||||
| Issue or Number: | 4 | ||||||
| DOI: | 10.1063/1.1714968 | ||||||
| Record Number: | CaltechAUTHORS:BACjap43c | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:BACjap43c | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 2510 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | Archive Administrator | ||||||
| Deposited On: | 06 Apr 2006 | ||||||
| Last Modified: | 08 Nov 2021 19:48 |
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