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A Solid-State Atomic Frequency Standard

White, Christopher J. and Hajimiri, Ali (2005) A Solid-State Atomic Frequency Standard. In: 2005 IEEE International Frequency Control Symposium and Exposition. Proceedings of the IEEE International Frequency Control Symposium and Exposition. IEEE , Piscataway, NJ, pp. 940-946. ISBN 0-7803-9052-0 .

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This paper describes a new class of frequency reference. The frequency source uses the same operating principle as a passive atomic frequency standard; however, the device is entirely solid-state, removing many cost and reliability issues associated with gas phase atomic clocks. More specifically, the "atomic resonance" is derived from zero-field magnetic resonance transitions of the vanadium ion in magnesium oxide. The characteristics of these resonances will be described in detail. The apparatus for measuring the "atomic" resonances uses a microwave resonant cavity and frequency-discriminator circuit. Using integrated circuits, the radio-frequency signal processing functions can be implemented at very low cost in a reliable manufacturing process. We discuss the system design and the measurement sensitivity. The estimated short term stability is in the range of 10^(-8) to 10^(-9) @ 1 s. Advantages of the new frequency reference may include immunity to vibration, reduced aging compared to crystal oscillators, and immediate cold start.

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Additional Information:© 2005 IEEE. Issue Date: 29-31 Aug. 2005. Date of Current Version: 16 January 2006. The authors thank Richard Bramley for generously discussing his earlier zero-field paramagnetic resonance work. Thanks also to James White for assisting with the resonator fabrication, and to Philip Feng for annealing the magnesium oxide crystals.
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INSPEC Accession Number8903689
Record Number:CaltechAUTHORS:20110825-151120289
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Official Citation:White, C.J.; Hajimiri, A.H.; , "A solid-state atomic frequency standard," Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International , vol., no., pp. 7 pp., 29-31 Aug. 2005 doi: 10.1109/FREQ.2005.1574061 URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:25106
Deposited By: Tony Diaz
Deposited On:25 Aug 2011 22:56
Last Modified:23 Aug 2016 10:04

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