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Advanced gem characterization

Rossman, George R. (2011) Advanced gem characterization. Gems and Gemology, 47 (2). pp. 124-125. ISSN 0016-626X.

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As clever minds combine an ever-increasing menu of high-tech methods in the quest to enhance the properties of both natural and synthetic gems, the challenges of gem characterization continue to grow rapidly. Gemology has adopted new methods to keep pace. Techniques considered advanced a decade ago-such as infrared, Raman, X-ray fluorescence, and photoluminescence spectroscopy, as well as LA-ICP-MS-are now routine analytical tools in well-equipped gemological laboratories. Trace-element analyses at the parts per million level are now at the forefront of determining locality of origin and treatments. New methods now being used in academic and industrial laboratories will become increasingly important in gemological labs as the technology applied to gem treatments rapidly advances.

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Rossman, George R.0000-0002-4571-6884
Additional Information:© 2011 Gemological Institute of America Inc.
Issue or Number:2
Record Number:CaltechAUTHORS:20110912-094728889
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:25293
Deposited By: Jason Perez
Deposited On:12 Sep 2011 20:09
Last Modified:03 Oct 2019 03:04

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