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Low-Complexity Codes for Random and Clustered High-Order Failures in Storage Arrays

Cassuto, Yuval and Bruck, Jehoshua (2009) Low-Complexity Codes for Random and Clustered High-Order Failures in Storage Arrays. California Institute of Technology , Pasadena, CA. (Unpublished)

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RC (Random/Clustered) codes are a new efficient array-code family for recovering from 4-erasures. RC codes correct most 4-erasures, and essentially all 4-erasures that are clustered. Clustered erasures are introduced as a new erasure model for storage arrays. This model draws its motivation from correlated device failures, that are caused by physical proximity of devices, or by age proximity of endurance-limited solid-state drives. The reliability of storage arrays that employ RC codes is analyzed and compared to known codes. The new RC code is significantly more efficient, in all practical implementation factors, than the best known 4-erasure correcting MDS code. These factors include: small-write update-complexity, full-device update-complexity, decoding complexity and number of supported devices in the array.

Item Type:Report or Paper (Technical Report)
Cassuto, Yuval0000-0001-6369-6699
Bruck, Jehoshua0000-0001-8474-0812
Additional Information:This work was supported in part by the Caltech Lee Center for Advanced Networking.
Group:Parallel and Distributed Systems Group
Subject Keywords:Array codes, clustered erasures, correlated failures, storage arrays
Record Number:CaltechPARADISE:2009.ETR098
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Usage Policy:You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format.
ID Code:26129
Deposited By: Imported from CaltechPARADISE
Deposited On:04 Dec 2009
Last Modified:09 Mar 2020 13:18

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