Kajiya, James T. (1982) Ray Tracing Parametric Patches. California Institute of Technology . (Unpublished) https://resolver.caltech.edu/CaltechCSTR:1982.5017-tr-82
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Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechCSTR:1982.5017-tr-82
Abstract
This paper describes an algorithm that uses ray tracing techniques to display bivariate polynomial surface patches. A new intersection algorithm is developed which uses ideas from algebraic geometry to obtain a numerical procedure for finding the intersection of a ray and a patch without subdivision. The algorithm may use complex coordinates for the (u,v)-parameters of the patches. The choice of these coordinates makes the computations more uniform, so that there are fewer special cases to be considered. In particular, the appearance and disappearance of silhouette edges can be handled quite naturally. The uniformity of these techniques may be suitable for implementation on either a general purpose pipelined machine, or on special purpose hardware.
Item Type: | Report or Paper (Technical Report) |
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Group: | Computer Science Technical Reports |
Record Number: | CaltechCSTR:1982.5017-tr-82 |
Persistent URL: | https://resolver.caltech.edu/CaltechCSTR:1982.5017-tr-82 |
Usage Policy: | You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format. |
ID Code: | 26984 |
Collection: | CaltechCSTR |
Deposited By: | Imported from CaltechCSTR |
Deposited On: | 06 Aug 2002 |
Last Modified: | 03 Oct 2019 03:19 |
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