DeBenedictis, Erik P. (1983) Techniques for Testing Integrated Circuits. California Institute of Technology . (Unpublished) https://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82
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| Item Type: | Report or Paper (Technical Report) |
|---|---|
| Group: | Computer Science Technical Reports |
| Record Number: | CaltechCSTR:1982.4777-tr-82 |
| Persistent URL: | https://resolver.caltech.edu/CaltechCSTR:1982.4777-tr-82 |
| Usage Policy: | You are granted permission for individual, educational, research and non-commercial reproduction, distribution, display and performance of this work in any format. |
| ID Code: | 27059 |
| Collection: | CaltechCSTR |
| Deposited By: | Imported from CaltechCSTR |
| Deposited On: | 02 Jan 2003 |
| Last Modified: | 03 Oct 2019 03:20 |
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