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Preferred Position of the Detector for MeV Backscattering Spectrometry

Eisen, F. H. and Nicolet, M.-A. (2003) Preferred Position of the Detector for MeV Backscattering Spectrometry. In: Application of accelerators in research and industry. AIP Conference Proceedings. No.680. American Institute of Physics , Melville, NY, pp. 411-413. ISBN 0-7354-0149-7.

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When an amorphous target is tilted with respect to the incident beam, the yield of an MeV backscattering spectrum will not change height if the measurements are executed under suitable conditions. One of these involves the position of the detector with respect to the plane defined by the directions of the incident beam and the tilt axis, as demonstrated here. The results clarify early data on the subject.

Item Type:Book Section
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Additional Information:© 2003 American Institute of Physics. Issue Date: 26 August 2003.
Subject Keywords:mass spectroscopic chemical analysis, data analysis, Rutherford backscattering, particle detectors, angular measurement, position control
Series Name:AIP Conference Proceedings
Issue or Number:680
Classification Code:PACS: 82.80.Ms; 81.70.Jb; 68.49.Sf; 07.75.+h
Record Number:CaltechAUTHORS:20111011-081811288
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Official Citation:Preferred Position of the Detector for MeV Backscattering Spectrometry F. H. Eisen and M.-A. Nicolet, AIP Conf. Proc. 680, 411 (2003), DOI:10.1063/1.1619747
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:27152
Deposited By: Tony Diaz
Deposited On:11 Oct 2011 20:18
Last Modified:09 Nov 2021 16:46

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