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X-ray high-resolution diffraction using refractive lenses

Drakopoulos, Michael and Snigirev, Anatoly and Snigireva, Irina and Schilling, Jörg (2005) X-ray high-resolution diffraction using refractive lenses. Applied Physics Letters, 86 (1). Art. No. 014102. ISSN 0003-6951. doi:10.1063/1.1843282.

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Refractive x-ray lenses have recently been applied for imaging and scanning microscopy with hard x rays. We report the application of refractive lenses in an optical scheme for high-resolution x-ray diffraction, performed at a high brilliance synchrotron radiation source. An experimental proof of principle and a theoretical discussion are presented. In particular, we observe the x-ray diffraction pattern from a two-dimensional photonic crystal with 4.2 µm periodicity, which normally is employed to scatter light in the infrared.

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Additional Information:©2005 American Institute of Physics (Received 21 July 2004; accepted 1 November 2004; published online 23 December 2004) The authors would like to thank R. Rueffer, A. Chumakov, O. Leupold, and J.-P. Celse from beamline ID18 for their excellent support. As well, they appreciate Viktor Kohn’s critical remarks during the preparation of the manuscript.
Subject Keywords:X-ray diffraction; lenses; X-ray optics; synchrotron radiation; photonic crystals
Issue or Number:1
Record Number:CaltechAUTHORS:DRAapl05
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2725
Deposited By: Archive Administrator
Deposited On:24 Apr 2006
Last Modified:08 Nov 2021 19:50

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