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Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator

Black, Eric D. and Grudinin, Ivan S. and Rao, Shanti R. and Libbrecht, Kenneth G. (2004) Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator. Journal of Applied Physics, 95 (12). pp. 7655-7659. ISSN 0021-8979. doi:10.1063/1.1728312.

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We have developed a technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse of the cavity over conventional interferometric measurements. In this paper we present a description of the technique, and we discuss how the properties of thin films can be deduced from the photothermal response. As an example of the technique, we report a measurement of the thermal properties of a multilayer dielectric mirror similar to those used in interferometric gravitational wave detectors.

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Libbrecht, Kenneth G.0000-0002-8744-3298
Additional Information:©2004 American Institute of Physics. (Received 23 October 2003; accepted 5 March 2004) Many thanks to Alan Weinstein for carefully reading this manuscript and for providing many helpful suggestions. This work was supported by the NSF under Grant No. PHY98-01158.
Subject Keywords:silicon compounds; titanium compounds; dielectric thin films; thermal expansion; thermal conductivity; Fabry-Perot resonators; Fabry-Perot interferometers; photothermal spectroscopy
Issue or Number:12
Record Number:CaltechAUTHORS:BLAjap04
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2767
Deposited By: Archive Administrator
Deposited On:26 Apr 2006
Last Modified:08 Nov 2021 19:50

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