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Characterization of a new photorefractive material: Kl-yLyT1-xNx

Agranat, Aharon and Hofmeister, Rudy and Yariv, Amnon (1992) Characterization of a new photorefractive material: Kl-yLyT1-xNx. Optics Letters, 17 (10). pp. 713-715. ISSN 0146-9592.

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We report the growth and characterization of a new photorefractive material, potassium lithium tantalate niobate (KLTN). A KLTN crystal doped with copper is demonstrated to yield high diffraction efficiency of photorefractive gratings in the paraelectric phase. Voltage-controllable index gratings with n, = 8.5 x 10^-5 were achieved, which yielded diffraction efficiencies of 75% in a 2.9-mm-thick sample. In addition, diffraction was observed in the paraelectric phase without an applied field. This effect is attributed to a growth-induced strain field.

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Additional Information:© 1992 Optical Society of America Received January 15, 1992 This research is supported by the U.S. Army Research Office.
Issue or Number:10
Record Number:CaltechAUTHORS:AGRol92
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:2884
Deposited By: Archive Administrator
Deposited On:04 May 2006
Last Modified:02 Oct 2019 22:57

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