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Testing and Structured Design

DeBenedictis, Erik P. and Seitz, Charles L. (1982) Testing and Structured Design. California Institute of Technology , Pasadena, CA. (Submitted)

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This paper describes part of an integrated circuit testing project carried out at Caltech between 1979 and 1982. The central theme and result of the project is a language or notation for describing tests for complex integrated circuits. The evolution of this test language has been guided by many considerations, including (1) its implementation in a working, interactive test system called FIFI, (2) its fit to ideas about the architecture of high-performance test instruments, and (3) its expressivity for a design-for-testability strategy for chip designs structured in the general style presented by Mead and Conway [1].

Item Type:Report or Paper (Technical Report)
Additional Information:Copyright (C) 1982 Caltech. All Rights Reserved. The research described in this paper was sponsored by the Defense Advanced Research Projects Agency, ARPA Order number 3771, and monitored by the Office of Naval Research under contract number N0001 4-79-C-0597. To be published in the Proceedings of the International Test Conference, Cherry Hill N.J., 1982. Caltech C.S. Deparment Document Number 4778.
Group:Computer Science Technical Reports
Funding AgencyGrant Number
Defense Advanced Research Projects Agency (DARPA)ARPA order 3771
Office of Naval ResearchN00014-79-C-0597
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Computer Science Technical Memorandum4778
Record Number:CaltechAUTHORS:20120419-103122492
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:30195
Deposited On:23 Apr 2012 21:34
Last Modified:03 Oct 2019 03:48

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