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Plasticity of indium nanostructures as revealed by synchrotron X-ray microdiffraction

Budiman, Arief Suriadi and Lee, Gyuhyon and Burek, Michael J. and Jang, Dongchan and Han, Seung Min J. and Tamura, Nobumichi and Kunz, Martin and Greer, Julia R. and Tsui, Ting Y. (2012) Plasticity of indium nanostructures as revealed by synchrotron X-ray microdiffraction. Materials Science and Engineering A, 538 . pp. 89-97. ISSN 0921-5093. https://resolver.caltech.edu/CaltechAUTHORS:20120420-100036179

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Abstract

Indium columnar structures with diameters near 1 μm were deformed by uniaxial compression at strain rates of approximately 0.01 and 0.001 s^(−1). Defect density evolution in the nanopillars was evaluated by applying synchrotron Laue X-ray microdiffraction (μSLXRD) on the same specimens before and after deformation. Results of the μSLXRD measurements indicate that the dislocation density increases as a result of mechanical deformation and is a strong function of strain rate. These results suggest that the rate of defect generation during the compression tests exceeds the rate of defect annihilation, implying that plasticity in these indium nanostructures commences via dislocation multiplication rather than nucleation processes. This is in contrast with the behaviors of other materials at the nanoscale, such as, gold, tin, molybdenum, and bismuth. A hypothesis based on the dislocation mean-free-path prior to the multiplication process is proposed to explain this variance.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.msea.2012.01.017DOIArticle
http://www.sciencedirect.com/science/article/pii/S0921509312000329PublisherArticle
ORCID:
AuthorORCID
Jang, Dongchan0000-0002-2814-9734
Tamura, Nobumichi0000-0002-3698-2611
Greer, Julia R.0000-0002-9675-1508
Additional Information:© 2012 Elsevier B.V. All rights reserved. Received 10 August 2011. Revised 9 December 2011. Accepted 9 January 2012. Available online 17 January 2012. The authors gratefully acknowledge critical support and infrastructure provided for this work by the Department of Energy (DOE), Office of Science, and Office of Basic Energy Sciences. W.D. Nix is gratefully acknowledged for his support in providing the nanomechanical testing facility at Stanford. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences Division, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231 at Lawrence Berkeley National Laboratory and University of California, Berkeley, California. The move of the micro-diffraction program from ALS beamline 7.3.3 onto to the ALS superbend source 12.3.2 was enabled through the NSF grant #0416243. One of the authors (ASB) is supported by the Director, Los Alamos National Laboratory (LANL), under the Director’s Postdoctoral Research Fellowship program (LDRD/X93V). T.Y. Tsui thanks Canadian NSERC Discovery, NSERC Research Tools and Instruments, and the Canada Foundation for Innovation (CFI) for the financial support of this research. JRG gratefully acknowledges the support of Office of Naval Research (ONR) through grant N000140910883. S.M. Han would like to thank National Research Foundation of Korea under the contract No. N01110283.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-AC0205CH11231
Los Alamos National Laboratory (LANL) Director’s Postdoctoral Research Fellowship ProgramLDRD/X93V
Natural Sciences and Engineering Research Council of Canada (NSERC)UNSPECIFIED
Canada Foundation for Innovation (CFI) UNSPECIFIED
Office of Naval Research (ONR)N000140910883
National Research Foundation of KoreaN01110283
Subject Keywords:Indium; Nanopillar; X-ray microdiffraction; Microstructure; Dislocation
Record Number:CaltechAUTHORS:20120420-100036179
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20120420-100036179
Official Citation:Arief Suriadi Budiman, Gyuhyon Lee, Michael J. Burek, Dongchan Jang, Seung Min J. Han, Nobumichi Tamura, Martin Kunz, Julia R. Greer, Ting Y. Tsui, Plasticity of indium nanostructures as revealed by synchrotron X-ray microdiffraction, Materials Science and Engineering: A, Volume 538, 15 March 2012, Pages 89-97, ISSN 0921-5093, 10.1016/j.msea.2012.01.017. (http://www.sciencedirect.com/science/article/pii/S0921509312000329)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:30215
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:20 Apr 2012 17:35
Last Modified:03 Oct 2019 03:48

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