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Robust outliers detection in image point matching

Beckouche, Simon and Leprince, Sébastien and Sabater, Neus and Ayoub, François (2011) Robust outliers detection in image point matching. In: 2011 IEEE International Conference on Computer Vision : Workshops : 6-13 November 2011, Barcelona, Spain. IEEE , Piscataway, NJ, pp. 180-187.

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Classic tie-point detection algorithms such as the Scale Invariant Feature Transform (SIFT) show their limitations when the images contain drastic changes or repetitive patterns. This is especially evident when considering multi-temporal series of images for change detection. In order to overcome this limitation we propose a new algorithm, the Affine Parameters Estimation by Random Sampling (APERS), which detects the outliers in a given set of matched points. This is accomplished by estimating the global affine transform defined by the largest subset of points and by detecting the points which are not coherent (outliers) with the transform. Comparisons with state-of-the-art methods such as GroupSAC or ORSA demonstrate the higher performance of the proposed method. In particular, when the proportion of outliers varies between 60% and 90% APERS is able to reject all the outliers while the others fail. Examples with real images and a shaded Digital Elevation Model are provided.

Item Type:Book Section
Related URLs:
URLURL TypeDescription
Leprince, Sébastien0000-0003-4555-8975
Ayoub, François0000-0002-7389-8400
Additional Information:© 2011 IEEE. Date of Current Version: 16 January 2012. We thank the Keck Institute for Space Studies (KISS) foundation for their support, as well as Jean-Philippe Avouac for hosting this research, and Sylvain Barbot for his stimulating discussions.
Group:Keck Institute for Space Studies
Funding AgencyGrant Number
Keck Institute for Space Studies (KISS)UNSPECIFIED
Record Number:CaltechAUTHORS:20120420-110105977
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Official Citation:Beckouche, S.; Leprince, S.; Sabater, N.; Ayoub, F.; , "Robust outliers detection in image point matching," Computer Vision Workshops (ICCV Workshops), 2011 IEEE International Conference on , vol., no., pp.180-187, 6-13 Nov. 2011 doi: 10.1109/ICCVW.2011.6130241
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:30222
Deposited By: Tony Diaz
Deposited On:23 Apr 2012 16:22
Last Modified:26 Oct 2022 22:12

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