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Structural perfection in poorly lattice matched heterostructures

Miles, R. H. and McGill, T. C. (1989) Structural perfection in poorly lattice matched heterostructures. Journal of Vacuum Science and Technology B, 7 (4). pp. 753-757. ISSN 1071-1023. doi:10.1116/1.584639.

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Continuum elastic theory is applied to the formation of misfit dislocations and point defects in strained layer structures. Explicit calculations of the energies of misfit dislocations in the double‐ and single‐kink geometries yield line tensions below which strained films are stable with respect to defect formation. Our results yield a mismatch‐dependent stability limit which, in the double kink case, differs from the Matthews–Blakeslee model by a geometrical factor and by the addition of a stress term associated with climb of the misfit dislocation. While our calculations yield equilibrium stability limits which may not correspond to observed critical thicknesses, the calculated stresses may be applied to descriptions of the kinetics of strain relief in films grown beyond these limits. Last, calculations of strain‐related contributions to the free energy of formation of point defects suggest a contribution │ΔG_(strain)│ ≃0.25 eV for a 5% lattice mismatch. This suggests a means of suppressing or enhancing the formation of vacancies or interstitials in semiconductors favoring these defects.

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Additional Information:© 1989 American Vacuum Society. Received 9 February 1989; accepted 6 April l989. The authors are grateful for fruitful discussions with J. P. Hirth, B. M. Clemens, R. J. Hauenstein, O. J. Marsh, J. O. McCaldin, and J. A. Van Vechten.
Subject Keywords:Heterostructures, Crystal structure, Interface structure, Point defects, Misfit dislocations, Continuum mechanics, Elasticity, Layered materials, Strains
Issue or Number:4
Classification Code:PACS: 68.35.Dv; 62.20.D-
Record Number:CaltechAUTHORS:20120524-102445268
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:31629
Deposited By: Tony Diaz
Deposited On:24 May 2012 21:08
Last Modified:09 Nov 2021 19:57

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