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Characterization of domain walls in BaTiO3 using simultaneous atomic force and piezo response force microscopy

Franck, Christian and Ravichandran, Guruswami and Bhattacharya, Kaushik (2006) Characterization of domain walls in BaTiO3 using simultaneous atomic force and piezo response force microscopy. Applied Physics Letters, 88 (10). Art. No. 102907. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:FRAapl06

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Abstract

In this letter a method to simultaneously measure the physical and the polarization thickness of a 90° domain wall in a ferroelectric perovskite is presented. This method combines accurate atomic force microscopy and piezoresponse force microscopy scans of the same area with little drift and an analysis of the entire scanned area. It is found that the physical thickness is significantly narrower (about seven and a half times) than the polarization thickness in a 90° domain wall in BaTiO3. Evidence of the trapping of defects at such domain walls is also found.


Item Type:Article
ORCID:
AuthorORCID
Bhattacharya, Kaushik0000-0003-2908-5469
Additional Information:©2006 American Institute of Physics (Received 3 November 2005; accepted 31 January 2006; published online 10 March 2006) The authors gratefully acknowledge the financial support of the U.S. Army Research Office (DAAD-19-01-1-0517). They thank Dr. D. Shilo for his help with the experimental investigation.
Group:GALCIT
Subject Keywords:barium compounds; ferroelectric materials; electric domain walls; atomic force microscopy; dielectric polarisation
Issue or Number:10
Record Number:CaltechAUTHORS:FRAapl06
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:FRAapl06
Alternative URL:http://dx.doi.org/10.1063/1.2185640
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:3163
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:17 May 2006
Last Modified:29 Sep 2016 23:16

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