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Time-of-flight mass spectrometry of mineral volatilization: Toward direct composition analysis of shocked mineral vapor

Austin, Daniel E. and Shen, Andy H. T. and Beauchamp, J. L. and Ahrens, Thomas J. (2012) Time-of-flight mass spectrometry of mineral volatilization: Toward direct composition analysis of shocked mineral vapor. Review of Scientific Instruments, 83 (4). Art. No. 044502. ISSN 0034-6748. https://resolver.caltech.edu/CaltechAUTHORS:20120529-090456353

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Abstract

We have developed an orthogonal-acceleration time-of-flight mass spectrometer to study the volatiles produced when a mineral's shock-compressed state is isentropically released, as occurs when a shock wave, driven into the mineral by an impact, reflects upon reaching a free surface. The instrument is designed to use a gun or explosive-launched projectile as the source of the shock wave, impact onto a flange separating a poor vacuum and the high vacuum (10^(−7) Torr) interior of the mass spectrometer, and transmission of the shock wave through the flange to a mineral sample mounted on the high-vacuum side of the flange. The device extracts and analyzes the neutrals and ions produced from the shocked mineral prior to the possible occurrence of collateral instrument damage from the shock-inducing impact. The instrument has been tested using laser ablation of various mineral surfaces, and the resulting spectra are presented. Mass spectra are compared with theoretical distributions of molecular species, and with expected distributions from laser desorption.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1063/1.4705745 DOIArticle
http://rsi.aip.org/resource/1/rsinak/v83/i4/p044502_s1PublisherArticle
ORCID:
AuthorORCID
Beauchamp, J. L.0000-0001-8839-4822
Additional Information:© 2012 American Institute of Physics. Received 2 November 2011; accepted 8 April 2012; published online 25 April 2012. Contribution No. 8891 of the Division of Geological and Planetary Sciences, California Institute of Technology.
Subject Keywords:laser ablation, mass spectroscopic chemical analysis, shock wave effects, time of flight spectrometers
Other Numbering System:
Other Numbering System NameOther Numbering System ID
Caltech Division of Geological and Planetary Sciences8891
Issue or Number:4
Classification Code:PACS: 82.80.Rt; 61.80.Ba; 82.40.Fp
Record Number:CaltechAUTHORS:20120529-090456353
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20120529-090456353
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:31670
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:01 Jun 2012 23:34
Last Modified:03 Oct 2019 03:53

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