Feldman, L. C. and Silverman, P. J. and Stensgaard, I. and Cheung, N. (1979) MeV ion scattering from thin Si single crystals: A novel approach to interface studies. Journal of Vacuum Science and Technology, 16 (5). p. 1457. ISSN 0022-5355. doi:10.1116/1.570220. https://resolver.caltech.edu/CaltechAUTHORS:20120725-132543388
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| Item Type: | Article | |||||||||
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| Additional Information: | © 1979 American Vacuum Society. Received 13 September 1979. Work performed as a resident visitor at Bell Laboratories. | |||||||||
| Issue or Number: | 5 | |||||||||
| Classification Code: | PACS: 68.20. + t, 79.20.Nc, 61.80.Jh, 61.80.Mk | |||||||||
| DOI: | 10.1116/1.570220 | |||||||||
| Record Number: | CaltechAUTHORS:20120725-132543388 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20120725-132543388 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 32722 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | INVALID USER | |||||||||
| Deposited On: | 25 Jul 2012 20:51 | |||||||||
| Last Modified: | 09 Nov 2021 21:29 |
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