Giuliano, C. and Yariv, A. (1972) Self-focusing threshold of Gaussian-elliptic light beams. IEEE Journal of Quantum Electronics, 8 (6). pp. 588-589. ISSN 0018-9197. doi:10.1109/JQE.1972.1077170. https://resolver.caltech.edu/CaltechAUTHORS:20120809-133621098
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Abstract
There is now substantial evidence to indicate that the long damage filaments created by laser beams passing through solid materials are due to self-focusing.
Item Type: | Article | |||||||||
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Additional Information: | © 1972 IEEE. Date of Current Version: 06 January 2003. | |||||||||
Issue or Number: | 6 | |||||||||
DOI: | 10.1109/JQE.1972.1077170 | |||||||||
Record Number: | CaltechAUTHORS:20120809-133621098 | |||||||||
Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20120809-133621098 | |||||||||
Official Citation: | Giuliano, C.; Yariv, A.; , "Self-focusing threshold of Gaussian-elliptic light beams," Quantum Electronics, IEEE Journal of , vol.8, no.6, pp.588-589, June 1972 doi: 10.1109/JQE.1972.1077170 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1077170&isnumber=23232 | |||||||||
Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
ID Code: | 33057 | |||||||||
Collection: | CaltechAUTHORS | |||||||||
Deposited By: | Tony Diaz | |||||||||
Deposited On: | 09 Aug 2012 23:09 | |||||||||
Last Modified: | 09 Nov 2021 21:32 |
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