Giuliano, C. and Yariv, A. (1972) Self-focusing threshold of Gaussian-elliptic light beams. IEEE Journal of Quantum Electronics, 8 (6). pp. 588-589. ISSN 0018-9197. https://resolver.caltech.edu/CaltechAUTHORS:20120809-133621098
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Abstract
There is now substantial evidence to indicate that the long damage filaments created by laser beams passing through solid materials are due to self-focusing.
| Item Type: | Article | |||||||||
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| Additional Information: | © 1972 IEEE. Date of Current Version: 06 January 2003. | |||||||||
| Issue or Number: | 6 | |||||||||
| Record Number: | CaltechAUTHORS:20120809-133621098 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20120809-133621098 | |||||||||
| Official Citation: | Giuliano, C.; Yariv, A.; , "Self-focusing threshold of Gaussian-elliptic light beams," Quantum Electronics, IEEE Journal of , vol.8, no.6, pp.588-589, June 1972 doi: 10.1109/JQE.1972.1077170 URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1077170&isnumber=23232 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 33057 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Tony Diaz | |||||||||
| Deposited On: | 09 Aug 2012 23:09 | |||||||||
| Last Modified: | 03 Oct 2019 04:06 |
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