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Noise and Equivalent Circuit of Double Injection

Bilger, H. R. and Lee, D. H. and Nicolet, M-A. and McCarter, E. R. (1968) Noise and Equivalent Circuit of Double Injection. Journal of Applied Physics, 39 (13). pp. 5913-5918. ISSN 0021-8979. doi:10.1063/1.1656089.

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Measurements of the high‐frequency noise of a silicon double‐injection diode result in 〈i^2〉 = α⋅4kT(1/r)Δf with α=1.04 and in agreement with the literature. A new interpretation demands Nyquist noise with α≡1 in these devices at high frequencies. This is in accord with an equivalent circuit derived for the double‐injection process. Speculations are made on the general validity of Nyquist noise in nonlinear devices at high frequencies. In addition, generation‐recombination noise is suggested as the prime source of the low‐frequency noise.

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Additional Information:© 1969 The American Institute of Physics. Received 5 August 1968. Online Publication Date: 9 December 2003. Our acknowledgments go to the Naval Ordnance Test Station, Pasadena, California; the Jet Propulsion Laboratory, Pasadena, California; and the NASA Electronics Research Center, Cambridge, Massachusetts, all of whom supported phases of this work. We thank N. Haralambis for much help in the assembly of electronic equipment and data reduction and Dr. R. Baron for enlightening discussions. The double-injection diode was generously provided by O. J. Marsh, Hughes Research Laboratories, Malibu, California
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Naval Ordnance Test StationUNSPECIFIED
NASA Electronics Research CenterUNSPECIFIED
Issue or Number:13
Record Number:CaltechAUTHORS:20120827-112350834
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Official Citation:Noise and Equivalent Circuit of Double Injection H. R. Bilger, D. H. Lee, M‐A. Nicolet, and E. R. McCarter J. Appl. Phys. 39, 5913 (1968);
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:33561
Deposited By: Ruth Sustaita
Deposited On:27 Aug 2012 20:18
Last Modified:09 Nov 2021 21:35

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