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Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy

Kim, Il-Doo and Avrahami, Ytshak and Tuller, Harry L. and Park, Young-Bae and Dicken, Matthew J. and Atwater, Harry A. (2005) Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy. Applied Physics Letters, 86 (19). Art. No. 192907. ISSN 0003-6951. doi:10.1063/1.1923173.

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We have investigated the effect of texture on in-plane (IPP) and out- of plane (OPP) polarizations of pulsed-laser-deposited BaTiO3 thin films grown on Pt and La0.5Sr0.5CoO3 (LSCO) buffered Pt electrodes. The OPP and IPP polarizations were observed by piezoresponse force microscopy (PFM) for three-dimensional polarization analyses in conjunction with conventional diffraction methods using x-ray diffraction and reflection high energy electron diffraction measurements. BaTiO3 films grown on Pt electrodes exhibited highly (101) preferred orientation with higher IPP component whereas BaTiO3 film grown on LSCO/Pt electrodes showed (001) and (101) orientations with higher OPP component. Measured effective d(33) values of BaTiO3 films deposited on Pt and LSCO/ Pt electrodes were 14.3 and 54.0 pm/ V, respectively. Local piezoelectric strain loops obtained by OPP and IPP-PFM showed that piezoelectric properties were strongly related to film orientation.

Item Type:Article
Related URLs:
URLURL TypeDescription
Kim, Il-Doo0000-0002-9970-2218
Atwater, Harry A.0000-0001-9435-0201
Additional Information:© 2005 American Institute of Physics. Received 20 December 2004; accepted 16 March 2005; published online 3 May 2005. This work has been supported by the Army Research Office (ARO-MURI) under Grant No. DAAD 19-01-1-0517, and Arrowhead Research Corporation.
Funding AgencyGrant Number
Army Research Office (ARO)DAAD 19-01-1-0517
Arrowhead ResearchUNSPECIFIED
Subject Keywords:barium compounds; ferroelectric thin films; piezoelectric materials; piezoelectric thin films; pulsed laser deposition; atomic force microscopy; X-ray diffraction; reflection high energy electron diffraction; dielectric polarisation; piezoelectricity; dielectric hysteresis
Issue or Number:19
Record Number:CaltechAUTHORS:KIMapl05
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:3471
Deposited By: Tony Diaz
Deposited On:08 Jun 2006
Last Modified:08 Nov 2021 19:56

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