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Silicon Nanowire Charge-Trap Memory Incorporating Self-Assembled Iron Oxide Quantum Dots

Huang, Ruo-Gu and Heath, James R. (2012) Silicon Nanowire Charge-Trap Memory Incorporating Self-Assembled Iron Oxide Quantum Dots. Small, 8 (22). pp. 3417-3421. ISSN 1613-6810. https://resolver.caltech.edu/CaltechAUTHORS:20121213-093659505

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Abstract

Charge-trap non-volatile memory devices based upon the precise integration of quantum dot storage elements with silicon nanowire field-effect transistors are described. Template-assisted assembly yields an ordered array of FeO QDs within the trenches that separate highly aligned SiNWs, and injected charges are reversibly stored via Fowler–Nordheim tunneling into the QDs. Stored charges shift the transistor threshold voltages, providing the basis for a memory device. Quantum dot size is found to strongly influence memory performance metrics.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1002/smll.201200940 DOIArticle
http://onlinelibrary.wiley.com/doi/10.1002/smll.201200940/abstractPublisherArticle
ORCID:
AuthorORCID
Heath, James R.0000-0001-5356-4385
Additional Information:© 2012 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. Received: May 1, 2012. Published online: September 10, 2012. This work was funded by the Department of Energy, Basic Energy Sciences (DE-FG03-01ER46175). The authors acknowledge Dr. Jen-Kan Yu and Dr. Douglas Tham for assistance with device characterization.
Funders:
Funding AgencyGrant Number
Department of Energy (DOE)DE-FG03-01ER46175
Issue or Number:22
Record Number:CaltechAUTHORS:20121213-093659505
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20121213-093659505
Official Citation:Huang, R.-G. and Heath, J. R. (2012), Silicon Nanowire Charge-Trap Memory Incorporating Self-Assembled Iron Oxide Quantum Dots. Small, 8: 3417–3421. doi: 10.1002/smll.201200940
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:35972
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:17 Dec 2012 22:22
Last Modified:03 Oct 2019 04:33

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