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Determination of optical and microstructural parameters of ceria films

Oh, Tae-Sik and Tokpanov, Yury S. and Hao, Yong and Jung, WooChul and Haile, Sossina M. (2012) Determination of optical and microstructural parameters of ceria films. Journal of Applied Physics, 112 (10). Art. No. 103535 . ISSN 0021-8979.

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Light-matter interactions are of tremendous importance in a wide range of fields from solar energy conversion to photonics. Here the optical dispersion behavior of undoped and 20 mol. % Sm doped ceria thin films, both dense and porous, were evaluated by UV-Vis optical transmission measurements, with the objective of determining both intrinsic and microstructural properties of the films. Films, ranging from 14 to 2300 nm in thickness, were grown on single crystal YSZ(100) and MgO(100) using pulsed laser deposition (both dense and porous films) and chemical vapor deposition (porous films only). The transmittance spectra were analyzed using an in-house developed methodology combining full spectrum fitting and envelope treatment. The index of refraction of ceria was found to fall between 2.65 at a wavelength of 400 nm and 2.25 at 800 nm, typical of literature values, and was relatively unchanged by doping. Reliable determination of film thickness, porosity, and roughness was possible for films with thickness ranging from 500 to 2500 nm. Physically meaningful microstructural parameters were extracted even for films so thin as to show no interference fringes at all.

Item Type:Article
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URLURL TypeDescription DOIArticle
Haile, Sossina M.0000-0002-5293-6252
Additional Information:© 2012 American Institute of Physics. Received 30 March 2012; accepted 24 October 2012; published online 30 November 2012. The authors gratefully acknowledge financial support from the National Science Foundation under award CBET-038307. Additional support was provided by the Global Climate and Environment Program administered by Stanford University. Professor George Rossman kindly provided access to optical equipment and Professor Harry Atwater to XRR instrumentation in their respective laboratories. This work furthermore made use of facilities operated by the Geological and Planetary Sciences Division and by the Kavli Nanoscience Institute at Caltech.
Group:Kavli Nanoscience Institute
Funding AgencyGrant Number
Stanford Global Climate and Environment ProgramUNSPECIFIED
Subject Keywords:cerium compounds, chemical vapour deposition, crystal microstructure, doping, porosity, porous materials, pulsed laser deposition, refractive index, samarium, thin films, ultraviolet spectra, visible spectra
Issue or Number:10
Classification Code:PACS: 78.66.Nk; 81.15.Fg; 81.15.Gh; 68.55.aj; 78.20.Ci; 78.40.Ha
Record Number:CaltechAUTHORS:20130103-094855552
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:36140
Deposited By: Tony Diaz
Deposited On:09 Jan 2013 19:32
Last Modified:03 Oct 2019 04:35

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