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Sideband spectroscopy and dispersion measurement in microcavities

Li, Jiang and Lee, Hansuek and Yang, Ki Youl and Vahala, Kerry J. (2012) Sideband spectroscopy and dispersion measurement in microcavities. Optics Express, 20 (24). pp. 26337-26350. ISSN 1094-4087. http://resolver.caltech.edu/CaltechAUTHORS:20130118-145853804

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Abstract

The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible. The method is applicable for high-Q, micro-cavities having microwave rate free spectral range and has a relative precision of 5.5 × 10^(−6) for a 2 mm disk cavity with FSR of 32.9382 GHz and Q of 150 million.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1364/OE.20.026337DOIArticle
http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-24-26337PublisherArticle
ORCID:
AuthorORCID
Lee, Hansuek0000-0002-0748-7662
Yang, Ki Youl0000-0002-0587-3201
Vahala, Kerry J.0000-0003-1783-1380
Additional Information:© 2012 Optical Society of America. Received 17 Sep 2012; revised 31 Oct 2012; accepted 1 Nov 2012; published 7 Nov 2012. The authors acknowledge the financial support from the DARPA QuASAR program, the Institute for Quantum Information and Matter, an NSF Physics Frontiers Center with support of the Gordon and Betty Moore Foundation, NASA and the Kavli Nano Science Institute.
Group:Institute for Quantum Information and Matter, IQIM, Kavli Nanoscience Institute
Funders:
Funding AgencyGrant Number
Defense Advanced Research Projects Agency (DARPA)UNSPECIFIED
Institute for Quantum Information and Matter (IQIM)UNSPECIFIED
NSF Physics Frontiers CenterUNSPECIFIED
Gordon and Betty Moore FoundationUNSPECIFIED
NASAUNSPECIFIED
Kavli Nanoscience InstituteUNSPECIFIED
Classification Code:OCIS Codes: (130.3120) Integrated optics devices; (140.3945) Microcavities; (120.0120) Instrumentation, measurement, and metrology; (300.6380) Spectroscopy, modulation
Record Number:CaltechAUTHORS:20130118-145853804
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20130118-145853804
Official Citation:Jiang Li, Hansuek Lee, Ki Youl Yang, and Kerry J. Vahala, "Sideband spectroscopy and dispersion measurement in microcavities," Opt. Express 20, 26337-26344 (2012) http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-24-26337
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:36485
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:18 Jan 2013 23:24
Last Modified:17 Apr 2017 22:18

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