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Emergence of film-thickness- and grain-size-dependent elastic properties in nanocrystalline thin films

Lian, Jie and Lee, Seok-Woo and Valdevit, Lorenzo and Baskes, Michael I. and Greer, Julia R. (2013) Emergence of film-thickness- and grain-size-dependent elastic properties in nanocrystalline thin films. Scripta Materialia, 68 (5). pp. 261-264. ISSN 1359-6462. https://resolver.caltech.edu/CaltechAUTHORS:20130222-094935317

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Abstract

Molecular dynamics simulations of nanocrystalline Ni revealed that the in-plane Young’s modulus of 2.2 nm grained Ni film with ∼10 grains across its thickness was only 0.64% smaller than that of bulk, while it dropped to 24.1% below bulk value for ∼1 grain across film. This size dependence arises from the increased number of more compliant grains adjacent to the free surface. Simulations of nanocrystalline diamond revealed that the anharmonicity of the potential curve determined the sensitivity of the Young’s modulus to variations in the sample size.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1016/j.scriptamat.2012.10.031 DOIArticle
http://www.sciencedirect.com/science/article/pii/S1359646212006811PublisherArticle
ORCID:
AuthorORCID
Lee, Seok-Woo0000-0001-6752-5694
Greer, Julia R.0000-0002-9675-1508
Additional Information:© 2012 Acta Materialia Inc. Published by Elsevier Ltd. Received 10 October 2012; accepted 23 October 2012. Available online 7 November 2012. The authors gratefully acknowledge the financial support of DARPA through the MCMA program and SWL’s Kavli Nanoscience Institute post-doctoral fellowship. S.W.L. acknowledges Dr. Chris Weinberger for providing additional computing power for running simulations, and all the authors thank Dongchan Jang, Alan Jacobsen, Toby Schaedler and Bill Carter for helpful discussions.
Group:Kavli Nanoscience Institute
Funders:
Funding AgencyGrant Number
Defense Advanced Research Projects Agency (DARPA)UNSPECIFIED
Kavli Nanoscience InstituteUNSPECIFIED
Subject Keywords:Thickness effect; Nanocrystalline thin films; Young’s modulus; Nickel; Diamond
Issue or Number:5
Record Number:CaltechAUTHORS:20130222-094935317
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20130222-094935317
Official Citation:Jie Lian, Seok-Woo Lee, Lorenzo Valdevit, Michael I. Baskes, Julia R. Greer, Emergence of film-thickness- and grain-size-dependent elastic properties in nanocrystalline thin films, Scripta Materialia, Volume 68, Issue 5, March 2013, Pages 261-264, ISSN 1359-6462, 10.1016/j.scriptamat.2012.10.031. (http://www.sciencedirect.com/science/article/pii/S1359646212006811)
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:37068
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:22 Feb 2013 18:13
Last Modified:09 Oct 2019 21:03

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