A Caltech Library Service

Dislocation velocity on the {1212}<1213> slip systems of zinc

Blish, R. C., II and Vreeland, T., Jr. (1969) Dislocation velocity on the {1212}<1213> slip systems of zinc. Journal of Applied Physics, 40 (2). pp. 884-890. ISSN 0021-8979. doi:10.1063/1.1657479.

See Usage Policy.


Use this Persistent URL to link to this item:


Dislocation velocity on the {1212}<1213> slip systems of zinc monocrystals was deduced from the rate of growth of slip bands. Near 77°K dislocation velocity is directly proportional to stress, and screw dislocations move more rapidly than edge dislocations. The difference between edge and screw dislocation velocity can be interpreted in two ways. The pre-exponential factors in a thermal activation model may differ by a factor 4 while the common activation energy is 0.21 eV, or the pre-exponential factors are the same, but the activation energy for edge dislocations (0.22 eV) exceeds that for screws by 5%. Other experiments will be required to establish the appropriate model. The authors favor the second alternative since extra activation energy might be needed to change the core structure of the edge dislocations (which lie on the basal planes) to make them glissile. Near room temperature, dislocation velocity decreases and cross-glide increases with increasing temperature. It is suggested that dragging dipoles and debris caused by their dissociation are responsible for the decrease in dislocation velocity. Finally, it is shown that the temperature dependence of both the yield strength and the plastic modulus is similar to the temperature dependence of the stress required to produce a constant dislocation velocity.

Item Type:Article
Related URLs:
URLURL TypeDescription
Additional Information:©1969 The American Institute of Physics. Received 22 July 1968; revised 25 October 1968. The authors wish to express their appreciation to the U. S. Atomic Energy Commission who sponsored this investigation. The assistance of G. R. May and R. L. Norton in specimen preparation and testing is gratefully acknowledged.
Issue or Number:2
Record Number:CaltechAUTHORS:BLIjap69
Persistent URL:
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:3725
Deposited By: Tony Diaz
Deposited On:30 Jun 2006
Last Modified:08 Nov 2021 20:11

Repository Staff Only: item control page