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Low Voltage FESEM of Geological Materials

Ma, Chi and Rossman, George R. (2006) Low Voltage FESEM of Geological Materials. Microscopy Today, 14 . pp. 20-23. ISSN 1551-9295. https://resolver.caltech.edu/CaltechAUTHORS:20130430-100136607

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Abstract

Low voltage field emission SEM (i.e., operated at several hundred volts to 5 kV), offering advantages in surface imaging due to reduced beam penetration, was found to be particularly useful in the investigation of uncoated, fine, geological materials down to the nano-scale. Here are four examples to highlight projects being conducted in our FESEM facility.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://resolver.caltech.edu/CaltechAUTHORS:20130502-074541444Related ItemUNSPECIFIED
ORCID:
AuthorORCID
Ma, Chi0000-0002-1828-7033
Rossman, George R.0000-0002-4571-6884
Additional Information:© 2006 Microscopy Society of America. The Caltech Geology FESEM facility is supported in part by the MRSEC Program of the NSF under DMR-0080065. The projects are funded by the White Rose Foundation and the NSF.
Funders:
Funding AgencyGrant Number
NSF MRSEC ProgramDMR-0080065
White Rose FoundationUNSPECIFIED
NSFUNSPECIFIED
Record Number:CaltechAUTHORS:20130430-100136607
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20130430-100136607
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:38178
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:01 May 2013 23:09
Last Modified:09 Mar 2020 13:19

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