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Scanning tunneling spectroscopy of methyl- and ethyl-terminated Si(111) surfaces

Yu, Hongbin and Webb, Lauren J. and Heath, James R. and Lewis, Nathan S. (2006) Scanning tunneling spectroscopy of methyl- and ethyl-terminated Si(111) surfaces. Applied Physics Letters, 88 (25). Art. No. 252111. ISSN 0003-6951.

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Methyl- and ethyl-terminated Si(111) surfaces prepared by a two-step chlorination/alkylation method were characterized by low temperature scanning tunneling spectroscopy (STS). The STS data showed remarkably low levels of midgap states on the CH3- and C2H5-terminated Si surfaces. A large conductance gap relative to the Si band gap was observed for both surfaces as well as for the hydrogen-terminated Si(111) surface. This large gap is ascribed to scanning tunneling microscope tip-induced band bending resulting from a low density of midgap states which avoid pinning of the Fermi levels on these passivated surfaces.

Item Type:Article
Related URLs:
URLURL TypeDescription
Webb, Lauren J.0000-0001-9999-5500
Heath, James R.0000-0001-5356-4385
Lewis, Nathan S.0000-0001-5245-0538
Additional Information:© 2006 American Institute of Physics (Received 15 December 2005; accepted 30 March 2006; published online 22 June 2006) The authors acknowledge the National Science Foundation, Grant Nos. CHE-0213589 (NSL) and NSF-CCF-05204490, and the MARCO Materials Structures and Devices Focus Center (JRH) for support of this research. One of the authors (L.J.W.) thanks the NSF for a graduate fellowship. The authors thank Peigen Cao for helpful discussions and technical assistance.
Funding AgencyGrant Number
Microelectronics Advanced Research Corporation (MARCO)UNSPECIFIED
NSF Graduate Research FellowshipUNSPECIFIED
Subject Keywords:organic compounds; silicon; elemental semiconductors; scanning tunnelling spectroscopy; energy gap; Fermi level
Issue or Number:25
Record Number:CaltechAUTHORS:YUHapl06
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:3870
Deposited By: Archive Administrator
Deposited On:17 Jul 2006
Last Modified:17 Nov 2020 00:47

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