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Dielectric Constants of Tephroite, Fayalite and Olivine and the Oxide Additivity Rule

Shannon, R. D. and Subramanian, M. A. and Hosoya, S. and Rossman, G. R. (1991) Dielectric Constants of Tephroite, Fayalite and Olivine and the Oxide Additivity Rule. Physics and Chemistry of Minerals, 18 (1). pp. 1-6. ISSN 0342-1791 . https://resolver.caltech.edu/CaltechAUTHORS:20130801-103131008

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Abstract

The dielectric constants and dissipation factors of synthetic tephroite (Mn_2SiO_4), fayalite (Fe_3SiO_4) and a forsteritic olivine (Mg_(1.80)Fe_(0.22)SiO_4) were measured at 1 MHz using a two-terminal method and empirically determined edge corrections. The results are: tephroite, κ′_a= 8.79 tan δ_a = 0.0006 κ′_b = 10.20 tan δ_b = 0.0006 κ′_c= 8.94 tan δ_c= 0.0008 fayalite, k′_a = 8.80 tan δ_a = 0.0004 k′_b= 8.92 tan δ_b = 0.0018 k′_c = 8.58 tan δ_c = 0.0010 olivine, k′_a = 7.16 tan δ_a = 0.0006 k′_b = 7.61 tan δ_b = 0.0008 k′_c = 7.03 tan δ_c = 0.0006 The low dielectric constant and loss of the fayalite indicate an exceptionally low Fe^(3+) content. An FeO polarizability of 4.18 Å^3, determined from α_D(FeO) = [α_D(Fe_2SiO_4)-α_D(SiO_2)]/2, is probably a more reliable value for stoichiometric FeO than could be obtained from Fe_xO where x = 0.90–0.95. The agreement between measured dielectric polarizabilities as determined from the Clausius-Mosotti equation and those calculated from the sum of oxide polarizabilities according to α_D(M_2M′X4) = 2α_D(MX) + α_D(M′X_2) is ∼+2.8% for tephroite and +0.2% for olivine. The deviation from additivity in tephroite is discussed.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1007/BF00199037DOIArticle
http://link.springer.com/article/10.1007%2FBF00199037PublisherArticle
ORCID:
AuthorORCID
Rossman, G. R.0000-0002-4571-6884
Additional Information:© 1991 Springer-Verlag. Received October 9, 1990. Accepted January 8, 1991. We thank O.C. Kopp, J.H. Jones, R.T. Cygan and E.K. Graham for providing the fayalite crystals. R.W. Schiffer for sample preparation, R.A. Oswald for making the capacitance measurements, A. Brown (Studsvik Energiteknik AB, Nykoping, Sweden) and C. Foris for obtaining cell dimensions, J.T. Armstrong (California Inst. Technology, Pasadena, CA) for microprobe data, A.N. Mariano for orientation of the olivine crystal, and J. Kim for assistance with the spectroscopic measurements. This work was supported in part by National Science Foundation Grant EAR-86-18200.
Funders:
Funding AgencyGrant Number
NSFEAR-86-18200
Issue or Number:1
Record Number:CaltechAUTHORS:20130801-103131008
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20130801-103131008
Official Citation: Dielectric constants of tephroite, fayalite and olivine and the oxide additivity rule R. D. Shannon, M. A. Subramanian, S. Hosoya… Pages 1-6
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:39703
Collection:CaltechAUTHORS
Deposited By: Ruth Sustaita
Deposited On:01 Aug 2013 17:54
Last Modified:03 Oct 2019 05:09

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