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Scanning Electron-Microscopes and Other Beam Instruments for Spaceflight

Albee, Arden L. (1987) Scanning Electron-Microscopes and Other Beam Instruments for Spaceflight. Journal of Electron Microscopy Technique, 7 (2). p. 137. ISSN 0741-0581. doi:10.1002/jemt.1060070212.

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SEMPA (Scanning Electron Microscope and Particle Analyser) is-a newly developed spacecraft instrument, miniaturized from familiar laboratory instruments for NASA's Comet Rendezvous/Asteroid Flyby mission in the '90's. SEMPA will determine elemental composition, shape, morphology, and mineralogy of individual dust particles and charaterize the flux. Spaceflight requirements demanded tradeoffs against current instrument performance and design concepts to adopt to the space environment, minimize weight and power consumption, and increase the maintenance-free lifetime. Other instruments that utilize in-site excitation of "rocky" samples are being designed by U.S., Soviet, and European scientists for future space missions. Under consideration is excitation with ion beams, laser beams, white light, pulsed neutron generators, x-ray generators, and particle accelerations.

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Additional Information:© 1987 Wiley-Liss, Inc. Article first published online: 4 Feb. 2005.
Issue or Number:2
Record Number:CaltechAUTHORS:20130805-150254709
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Official Citation:(1987), Proceedings of the 13th western regional meeting of electron microscopists and microbeam analysts held in concord, California, June 24–26, 1987. J. Elec. Microsc. Tech., 7: 131–148. doi: 10.1002/jemt.1060070212
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:39769
Deposited By: Tony Diaz
Deposited On:06 Aug 2013 20:37
Last Modified:09 Nov 2021 23:47

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